To check the quality of a Silicon Drift Detector a series of laboratory measurements have to be done.
First an (I-V) measurement is done on the detector itself, in order to find possible local defects generating high current. It is very useful because permit us to preselect in a fast and simple way the "good" detectors from the leakage current point of view. This measurement is performed in a probe station using two needles.
Then the SDD is mounted on a detector card, and connected to it via ultrasonic wire bonding. This card is plugged into a motherboard (see the figure below), that provides all signals and bias voltages, as well as all connections and test points for the measurements.