Home > Community > Attività di ricerca > Gruppo 3 > Esperimenti conclusi > FINUDA > The radiation impact Gain variations for ISIM 4 Versione stampabile Cluster Charge after radiation damage 30% of the gain lost up to now on the first two chips of the p-side Cluster charge distributions measured dividing into four parts the p-side (two chips for each distribution) and the n-side (four chips for each distribution) along the phi and z coordinates, respectively. Cluster Charge after radiation damage 10% of the gain lost up to now on the whole module. Cluster Charge before radiation damage Cluster Charge difference
